News
News
Notice: Scanning Electron Microscope (FE-SEM JSM-7800F) Out of Service
Equipment
2025年9月9日
The Scanning Electron Microscope (FE-SEM JSM-7800F) is currently out of service due to a malfunction. We apologize for any inconvenience this may cause and will announce when the repairs are complete. Thank you for your understanding.
- Tohoku University
- Institute for Materials Research, Tohoku University
- Institute of Fluid Science, Tohoku University
- Institute of Multidisciplinary Research for Advanced Materials, Tohoku University
- Research Institute of Electrical Communication, Tohoku University
- Head Office of Enterprise Partnerships, Tohoku University
- Core Facility Center
- Bulk Soft Magnetic Materials, Tohoku University
- Advanced Imaging and Modeling Center for Soft-materials
(Tohoku AIMcS)
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